view article

Figure 5
Dissociated edge dislocations in a 30 × 30 × 30 nm crystal and corresponding displacement field (ux component) for aluminium (a), copper (b) and silver (c) crystals with a Wulff geometry. (d)–(f) Corresponding CXD patterns with g·b = 0 (g = 224). (g) and (h) Intensity profiles along [1[\overline 1]0] and [111] (logarithmic scale). The selected area of the reciprocal space is kept to the same value in all figures and is equal to 0.045 × 0.0675 Å−1.

Journal logoJOURNAL OF
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds