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Figure 5
Dissociated edge dislocations in a 30 × 30 × 30 nm crystal and corresponding displacement field (ux component) for aluminium (a), copper (b) and silver (c) crystals with a Wulff geometry. (d)–(f) Corresponding CXD patterns with g·b = 0 (g = 224). (g) and (h) Intensity profiles along [1[\overline 1]0] and [111] (logarithmic scale). The selected area of the reciprocal space is kept to the same value in all figures and is equal to 0.045 × 0.0675 Å−1.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 3| June 2015| Pages 621-644
https://doi.org/10.1107/S1600576715005324
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