view article
Figure 2
(a) A schematic diagram of the setup that allows the loading of a crystal under the plane strain condition, used for both the optical and X-ray imaging observations. (b) The experimental device, with (1) the refrigerated cell, (2) the setup for the mechanical test, (3) the compressed-air apparatus for loading, (4) the temperature sensors, (5) the tube for the supply of `cold' nitrogen, (6) the nitrogen release, (7) the return of `hot' nitrogen and (8) the power cable.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 3| June 2015| Pages 672-678
https://doi.org/10.1107/S1600576715006342
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS