A look-up table based approach to characterize crystal twinning for synchrotron X-ray Laue microdiffraction scans

Li, Y.; Wan, L.; Chen, K.

doi:10.1107/S1600576715004896

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 5
(a) Crystallographic orientation map of the calcite sample showing the angles between the crystal c axis and the surface normal. (b) The spatial distribution of {01 $[\overline 1]$ 8} twin boundaries. (c), (d) Two Laue diffraction patterns of the two scanning spots marked in (a), and (e) the corresponding {01 $[\overline 1]$ 8} stereographic projection. Scale bars represent 30 µm.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 48| Part 3| June 2015| Pages 747-757

https://doi.org/10.1107/S1600576715004896

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page