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Figure 2
Sketch of incoming and outgoing beam arrangement for noncoplanar profile measurement of Ge reflection 044 on a (111)-oriented Si substrate. Red spheres denote the positions of Si Bragg reflections and blue spheres are related to the reflections of Ge. Green spheres limit the area with accessible points in reciprocal space when the sample is fixed. (a) corresponds to the side view, while (b) indicates the top view. (c) corresponds to a three-dimensional sketch of reciprocal space.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 3| June 2015| Pages 655-665
https://doi.org/10.1107/S1600576715005397
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