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Figure 6
Diffraction profiles of a stack of curved (001) Si crystals measured at 19 keV at the ANKA synchrotron for the 111 and 220 reflections (solid black and dashed red lines, respectively). The inset shows the geometry of the diffraction experiment.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 3| June 2015| Pages 666-671
https://doi.org/10.1107/S1600576715006809
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