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Figure 1
Labelled sketch of the setup. Shown items: (1) X-ray source and focusing optic; (2) detector; (3) sample mounting stage of six-axis goniometer (shown fitted with a smaller goniometer used for system alignment); (4) six-axis goniometer; (5) over-beam webcam. The red arrow shows the path of the incident beam, parallel to the x axis.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 4| August 2015| Pages 1342-1345
https://doi.org/10.1107/S1600576715009097
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