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Figure 9
(a) NSF and SF intensity maps (I++, I- and I+-) from the Fe/Si pSM in stress (with 10 V bias) measured on V6 at Ha = 200 Oe. The simulations are done within the DWBA (b) considering vertical correlation of roughness along the stack and (c) without considering any such vertical correlation. The color bars encode the scattered intensity on a logarithmic scale for the measured and simulated maps. The false color indicates the strength of the scattered signal. The dark-red (pink) color indicates a maximum in intensity and violet (blue) indicates a minimum for the measured (simulated) map.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 4| August 2015| Pages 1023-1033
https://doi.org/10.1107/S1600576715009942
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