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Figure 7
Reflectivity scan of (PbSe)4+δ(TiSe2)4, a telluride misfit layer compound (Moore et al., 2014BB12). This sample has a multilayer structure with well defined out-of-plane stacking but rotational disorder between layers. This gives rise to oscillations in the reflectivity curve, combined with broad in-plane scattering. The left panel shows the projection of the images taken at different incident angles onto [q_{\parallel}] and qz. The right panel shows the specular rod obtained by integration along [q_{\parallel}] from −0.005 to 0.005 Å−1.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 4| August 2015| Pages 1324-1329
https://doi.org/10.1107/S1600576715009607
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