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Figure 3
The crystallographic orientation of the observed DS. (a) A section parallel to 0kl in the crystallographic reference frame in which the data were collected. The arrows indicate the radial ( [032 ]*) and transverse ([{ [{02\bar 3} ]^*}]) crystallographic directions. (b) The h0lr plane, where lr is the projection of the scattering vector onto the [032 ]* direction. The plane is perpendicular to the [{ [{02\bar 3} ]^*}] direction. Both orientations highlight the low-intensity plane appearing perpendicular to the [032 ]* direction. Such low-intensity planes are a typical feature of Huang scattering: diffuse X-ray scattering due to the presence of long-range deformation fields, centred by point defects.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 5| October 2015| Pages 1543-1550
https://doi.org/10.1107/S160057671501571X
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