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Figure 2
The setup for diffraction experiments on the BAMline, using a high-precision diffractometer with a sample holder (Θ) and an analyser arm (2Θ). An XCCD camera (1) or a calibrated photodiode (2) can be used as the detector (top drawing). An Si(111) crystal can be used as the analyser crystal to record the intrinsic width of the sample under investigation (bottom drawing).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 5| October 2015| Pages 1381-1390
https://doi.org/10.1107/S160057671501287X
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