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Figure 1
The principle of Kikuchi pattern measurement in the SEM. The primary electron beam e− is focused on a 70° tilted sample (ND denotes the sample normal direction), and the Kikuchi pattern is collected on a freely tiltable detector plane. PC marks the pattern centre of the gnomonic projection of the diffraction signal.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 5| October 2015| Pages 1405-1419
https://doi.org/10.1107/S1600576715014016
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