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Figure 1
Illustration of the powder diffractometer setup at the X04SA MS beamline. The detector (not fully shown) covers both negative and positive diffraction angles. For alignment purposes, the DAC can be moved along x and y inside the Eulerian cradle. During data collection, χ is stationary and ω oscillates.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 6| December 2015| Pages 1956-1963
doi:10.1107/S1600576715020865
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