Tuning the instrument resolution using chopper and time of flight at the small-angle neutron scattering diffractometer KWS-2

Radulescu, A.; Székely, N.K.; Polachowski, S.; Leyendecker, M.; Amann, M.; Buitenhuis, J.; Drochner, M.; Engels, R.; Hanslik, R.; Kemmerling, G.; Lindner, P.; Papagiannopoulos, A.; Pipich, V.; Willner, L.; Frielinghaus, H.; Richter, D.

doi:10.1107/S1600576715019019

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 10
SANS data of the AgBeh reference sample measured at KWS-2 in conventional (black) and TOF (red and blue) modes for different Δλ/λ_aim. Only data recorded in the central TOF channel are shown.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 48| Part 6| December 2015| Pages 1849-1859

doi:10.1107/S1600576715019019

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