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Figure 8
SANS curves of SiO2 particles in d-DMF measured at KWS-2 with different resolutions; symbols – data collected with the conventional (continuous) mode by varying the collimation length LC; lines – data collected with the TOF mode using the chopper adjusted for Δλ/λaim = 5% (see details in text) as recorded in different time slots (channels). The inset shows the first minimum in the form factor.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 6| December 2015| Pages 1849-1859
doi:10.1107/S1600576715019019
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