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Figure 2
Simulated displacements of Laue spots. Laue spots were collected from an Si crystal undergoing bending and labeled with their Miller indexes. Their displacements on the detector screen are as depicted by the arrows (magnified by a factor 50).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 6| December 2015| Pages 1805-1817
doi:10.1107/S1600576715018397
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