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Figure 4
σ values extracted at a large number of different points in the diffraction pattern (left) and fitted surface to the σ values (right) with R2 = 0.993. The red line connects data points of constant wavelength.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 6| December 2015| Pages 1627-1636
doi:10.1107/S1600576715016520
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