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Figure 8
Measured (top), fitted (middle) and differential (bottom) diffraction pattern of CuNCN data from POWGEN. The color bar of each picture denotes the intensity as a percentage of the largest intensity peak in the simulated diffraction pattern.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 6| December 2015| Pages 1627-1636
doi:10.1107/S1600576715016520
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