A Rietveld refinement method for angular- and wavelength-dispersive neutron time-of-flight powder diffraction data

Jacobs, P.; Houben, A.; Schweika, W.; Tchougréeff, A.L.; Dronskowski, R.

doi:10.1107/S1600576715016520

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 8
Measured (top), fitted (middle) and differential (bottom) diffraction pattern of CuNCN data from POWGEN. The color bar of each picture denotes the intensity as a percentage of the largest intensity peak in the simulated diffraction pattern.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 48| Part 6| December 2015| Pages 1627-1636

https://doi.org/10.1107/S1600576715016520

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