Journal of Applied Crystallography
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Figure 1
The definition of a structure parameter [exp(
δ
)] to describe the effect of atomic disorder caused by Li doping on the X-ray diffraction intensity of an Li
0.5
Ni
0.5
O thin film.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48
|
Part 6
|
December 2015
|
Pages 1896-1900
doi:10.1107/S1600576715020002
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The IUCr is a scientific union serving the interests of crystallographers and other scientists employing crystallographic methods.