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Figure 5
(a) Orientation mapping according to the inverse pole figure of the solidification direction on the cross section of the rod (same insets as in Fig. 4[link]). Missing points in the centre of the image are caused by beam damage. (b) An example of a SEM micrograph on a cross section prepared by FIB (secondary electron contrast, tilt-corrected). The rotation and inclination with respect to the horizontal image edge and the sample surface, respectively, are highlighted by blue lines. The mean value obtained by analysing several colonies is indicated by a dashed line – the standard deviation by dotted lines. (c) Stereographic projection of the determined orientations of the colony in the centre of (a). Blue lines indicate rotation and inclination of the lamella traces according to (a) and (b). For the pole projection of lattice planes, the normal vector of the planes is used.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 2| April 2016| Pages 442-449
https://doi.org/10.1107/S1600576716000911
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