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Figure 4
Representative TEM micrographs of the microstructure formed after 360 min isothermal hold at 473 K. (a) Panoramic view of the bainitic ferrite plate; 1, 2, 3 and 4 denote the positions of the diffraction patterns shown in (b). (b) Diffraction patterns from positions 1, 2, 3 and 4; arrows indicate the rotation of the zone axis [111]α. (c) Interface in the bainitic ferrite plate indicated by arrows in (a); the inset shows the diffraction pattern from the interface (zone axis [111]α). (d) Suggested area (outlined by dashed line) of a bainitic ferrite plate nucleated at the primary bainitic ferrite plate. M is martensite, BF is bainitic ferrite.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 2| April 2016| Pages 399-414
https://doi.org/10.1107/S1600576716000418
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