view article
Figure 1
(a) Measured R-SoXR of samples S1, S2 and S3 at 190.7 eV. (Measured data of S2 and S3 are shifted vertically for clarity.) (b) R-SoXR at two different photon energies near the B K edge of elementary boron for sample S1.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 2| April 2016| Pages 715-716
https://doi.org/10.1107/S1600576716003824
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS