Interlaced X-ray diffraction computed tomography

Vamvakeros, A.; Jacques, S.D.M.; Di Michiel, M.; Senecal, P.; Middelkoop, V.; Cernik, R.J.; Beale, A.M.

doi:10.1107/S160057671600131X

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 13
(a) Summed diffraction patterns of tomo scans 1 and 8 of IXRD-CT scan 1. (b) A region of interest of the two diffraction patterns, showing the main diffraction peaks generated by the two Na₂WO₄ phases.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 49| Part 2| April 2016| Pages 485-496

https://doi.org/10.1107/S160057671600131X

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