view article

Figure 2
X-ray diffraction scans (using Cu Kα1,2 radiation) of (a) as-prepared inert-gas condensed nanocrystalline Ho and (b) coarse-grained Ho. The inset in (a) compares the normalized 102 peak of nanocrystalline Ho with that of the coarse-grained Ho sample; the shoulder in the data of the coarse-grained sample is due to the Kα2 peak.

Journal logoJOURNAL OF
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds