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Figure 2
X-ray diffraction scans (using Cu Kα1,2 radiation) of (a) as-prepared inert-gas condensed nanocrystalline Ho and (b) coarse-grained Ho. The inset in (a) compares the normalized 102 peak of nanocrystalline Ho with that of the coarse-grained Ho sample; the shoulder in the data of the coarse-grained sample is due to the Kα2 peak.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 2| April 2016| Pages 533-538
https://doi.org/10.1107/S1600576716001898
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