view article
Figure 5
Magnetic field-dependent two-dimensional diffraction patterns of (a)–(c) nanocrystalline (D = 33 nm) and (d)–(f) coarse-grained (D ≳ 100 nm) Ho at 50 K after ZFC. H is horizontal in the plane of the detector and increases up to 5 T (virgin-curve data). The central square in each figure masks the region of the beam stop. The white dashed circles labelled `A' and `B' refer to features discussed in the main text.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 2| April 2016| Pages 533-538
https://doi.org/10.1107/S1600576716001898
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS