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Figure 2
Implementation of the fast grid scan in the DA+ GUI. (a) In the sample camera view the user can define the grid scan area and data collection parameters. Collected diffraction images are analyzed with DISTL and displayed with the color scheme of choice in the sample camera window. Analysis criteria such as property and resolution limits can be modified. The inset shows a photograph of the crystal in the loop. (b)–(d) Localization of microcrystals in the LCP on silicon nitride support at 100 K with the 3 × 3 µm microbeam. (b) On-axis microscope image. (c) Definition of the diffraction-based grid scan with 3 × 3 µm cells in the user interface. (d) Heat map of the diffraction results with red corresponding to the strongest diffraction.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 3| June 2016| Pages 944-952
doi:10.1107/S1600576716006233
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