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Figure 6
Spot-finding parameter optimization improves the success of diffraction-image integration for the XFEL diffraction data set of the Syt1/SNARE complex. Integration results with and without a spot-finding parameter grid search (without the Bravais lattice filter applied) are plotted as a percentage of the total collected diffraction images. A spot area of 10 pixels and spot height of 8σ were used for the integrations without grid search. A spot area range of 2–22 pixels and spot height range of 1–15σ were used for the grid searches.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 3| June 2016| Pages 1057-1064
doi:10.1107/S1600576716006683
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