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Figure 4
Selected region of the powder patterns showing the main diffraction peak of insoluble anhydrite for the low-content samples used to investigate the limit of detection. Top left: Cu Kα1 pattern for CGpQ_0.12A. Intermediate left: Cu Kα1 pattern for CGpQ_0.25A. Bottom left: SXRPD pattern for CGpQ_0.12A. Top right: Mo Kα1 pattern for CGpQ_0.12A. Intermediate right: Mo Kα1 pattern for CGpQ_0.25A. Bottom right: Mo Kα1 pattern for CGpQ_0.50A. The main peak of anhydrite, sin(θ)/λ = 0.143 Å−1, is located at 25.4, 11.6 and 12.7° 2θ for Cu Kα1, Mo Kα1 and synchrotron radiations, respectively. The peak at sin(θ)/λ = 0.1445 Å−1 is due to the soluble anhydrite coming from gypsum (constant content in all the samples). The very tiny peak at sin(θ)/λ = 0.1457 Å−1, slightly visible only in the SXRPD pattern, arises from SrSO4 coming also from gypsum.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 3| June 2016| Pages 722-735
doi:10.1107/S1600576716003873
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