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Figure 1
The X-ray diffraction pattern for the sample A-748K16h with the diffraction image (inset). Red circles indicate the measured data, green dashes the Bragg peak positions, the black line the calculated pattern, and the blue line the difference between the calculated pattern and the measured data.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 3| June 2016| Pages 923-933
doi:10.1107/S1600576716005744
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