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Figure 1
(a) A cross-sectional TEM image, (b) the corresponding SAED pattern and (c) a cross-sectional HRTEM image of a Pt/AlN multilayer film annealed at 873 K.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 3| June 2016| Pages 909-917
doi:10.1107/S1600576716005483
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