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Figure 6
Main panel: XRD pattern of all studied samples, sorted as in Fig. 3[link]. The inset at the top right shows the evolution of the position of the 001 reflection (when observable) as a function of sample Ca/Si ratio.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 3| June 2016| Pages 771-783
doi:10.1107/S1600576716003885
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