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Figure 3
The reflectivity of the test sample and the best fit without including the effects of the Zeeman energy. The data are shown as open symbols, with error bars corresponding to ±1σ according to the counting statistics and the resolution function of the instrument. The fits are shown as solid lines (the reduced χ2 for these fits is 25.0). The data were parametrized and fitted according to kz(in).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 4| August 2016| Pages 1121-1129
doi:10.1107/S1600576716007135
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