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Figure 16
Best-fit parameters (a) ξ and (b) S (with the ionization chamber reading I0 of the incident beam provided for comparison), and (c) M at all measured incident photon energies.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 4| August 2016| Pages 1209-1222
doi:10.1107/S1600576716009183
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