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![[Figure 8]](te5014fig8mag.jpg)
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Figure 8
(Left) Plot of energy versus azimuthal angle ϕ at which parasitic Bragg reflections can be excited on the I20-scanning four-bounce monochromator in the neighborhood of the Ni K edge. The plot was generated by software provided by one of the authors (Bowron, 2012  ). The software was based on the work of Rek et al. (1984). Each trace is labeled with its parasitic Bragg reflections. (Right) Experimental data showing glitches measured by a diode detector D4 between the first and second pair of bounces and by a diode detector D5 just downstream from the monochromator. The label for each glitch is on the far right. The solid circles on the left, which are connected by horizontal dotted lines to the corresponding measured glitches on the right, show the estimated true azimuthal angle ϕ of the crystal that produces each glitch (see Table 2). |
![[Figure 8]](te5014fig8.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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