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Figure 1
(a) AFM image of surface tracks on a rutile TiO2 (001) surface after exposure to 23 MeV I6+. The surface is irradiated with SHIs under grazing incidence (green arrow), giving rise to surface tracks aligned with the ion beam direction. The angle between the X-ray beam (blue arrow) for the GISAXS analysis and the ion beam is β. (b) Profile of a selected surface track with α denoting the tilt of the surface track. (c) Surface track length distribution for a SHI grazing-incidence angle of 1.25 ± 0.25°, determined from the analysis of 173 individual surface tracks. (d) Histogram showing the distribution of the number of nanohillocks within those surface tracks.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 5| October 2016| Pages 1704-1712
https://doi.org/10.1107/S1600576716013704
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