A rapid two-dimensional data collection system for the study of ferroelectric materials under external applied electric fields

Vergentev, T.; Bronwald, I.; Chernyshov, D.; Gorfman, S.; Ryding, S.H.M.; Thompson, P.; Cernik, R.J.

doi:10.1107/S1600576716011341

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 3
(a) The 200 reflection with the intensity on a log scale under an applied electric field of 1 kV mm⁻¹. The peak shows a number of distortions including twinning (wide mosaic spread) and diffuse scattering streaks. The time taken for the scan was approximately 4 h. (b) The regions tending to twin below the main peak.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 49| Part 5| October 2016| Pages 1501-1507

https://doi.org/10.1107/S1600576716011341

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