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Figure 2
The simulated EDXRD spectrum of quartz at 2θ = 154.5°, along with the positions and relative intensities of the Pd L characteristic emission lines and the calculated transmission curve of a 1 µm Rh foil mounted on a 7 µm polyester support (right-hand scale). The EDXRD spectrum incident at the detector is shown, prior to detection. Only the more intense Pd L emission lines are labelled.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 5| October 2016| Pages 1561-1571
https://doi.org/10.1107/S1600576716011936
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