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![[Figure 3]](nb5176fig3mag.jpg)
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Figure 3
(a) A CCD image of the quartz diffraction pattern (source excitation voltage 8 kV, emission current 0.75 mA), energy-selected in the range of approximately 2.75–3.3 keV. X-ray energies within this range are represented by different colours. The two boxed regions indicate the areas from which the on-coincidence (bottom) and off-coincidence (top) spectra were extracted. (b) The extracted spectra from the on- and off-coincidence regions shown in part (a). Also shown are the on-coincidence spectrum with a 1 µm Rh foil in the X-ray beam incident on the sample (source 8 kV, 1.0 mA) and the spectrum acquired with no Pd plate on the Cu anode (source 8 kV, 0.45 mA), extracted from the off-coincidence region shown in part (a). The on-coincidence spectrum with the Rh foil was normalized to the Pd Lα1 peak of the on-coincidence spectrum without the foil. The Cu anode spectrum was scaled so that the diffraction peak at ∼2.6 keV is equal in intensity to the corresponding peak in the off-coincidence spectrum. For all four data sets, the peak near 3.5 keV is mainly due to the pile-up of Si K fluorescence events. |
![[Figure 3]](nb5176fig3.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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