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Figure 6
Results acquired for the TWIP steel sample, with a 10 µm Ti foil mounted in front of the CCD; source excitation was 7.5 kV with an emission current of 1.0 mA. (a) A CCD image of the In Lβ1/austenite 200 diffraction arc. (b) A CCD image of the Ti Kβ/austenite 220 diffraction arc. (c) The on- and off-coincidence spectra extracted from the CCD data. The selected off-coincidence region was at the top of the CCD. The spectrum acquired with a Cu anode (source 7.5 kV, 1.4 mA; taken from the off-coincidence region of the CCD) is also shown for comparison, approximately normalized in intensity over the 4–6 keV range with the off-coincidence spectrum. Along with the enhanced diffraction peaks, the more prominent scattered and fluorescence peaks are labelled.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 5| October 2016| Pages 1561-1571
https://doi.org/10.1107/S1600576716011936
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