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Figure 1
A schematic diagram of the experimental geometry, showing the path of the beam and portions of the Debye–Scherrer rings collected on the detector. These rings were partially integrated in segments to form one-dimensional diffraction patterns to be analysed by Rietveld refinement. The DS rings can be integrated at different azimuthal angles to give in-plane and out-of-plane information.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 6| December 2016| Pages 1904-1911
https://doi.org/10.1107/S1600576716013935
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