A synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depth

Li, C.; Jacques, S.D.M.; Chen, Y.; Daisenberger, D.; Xiao, P.; Markocsan, N.; Nylen, P.; Cernik, R.J.

doi:10.1107/S1600576716013935

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 2
SEM image showing an APS TBC heat treated at 1423 K for 150 h with a `splat' microstructure. Micro cracks between splats are visible, as are the TGO, IGO and interface regions

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 49| Part 6| December 2016| Pages 1904-1911

https://doi.org/10.1107/S1600576716013935

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