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Figure 4
An example of the output from a Rietveld refinement of a diffraction pattern with an incident angle of 1.9°. The observed data are shown in green, the calculated pattern in red, and the difference between the observed and calculated patterns in grey. The ticks show the expected positions of the Bragg peaks. The fit is sufficiently good to measure lattice parameters to the fourth decimal place.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 6| December 2016| Pages 1904-1911
https://doi.org/10.1107/S1600576716013935
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