view article
Figure 1
SEM micrographs showing cross sections of the analysed thin films A (a), B (b) and C (c) on WC–Co substrates. In films A and B, the variation of the deposition conditions during the film growth resulted in the formation of graded microstructure.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 6| December 2016| Pages 2217-2225
https://doi.org/10.1107/S1600576716017258
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS