view article
Figure 6
GISAXS pattern for a not annealed (a) and an 873 K annealed sample (b). Both patterns were taken 0.1° above the critical angle of SiO2.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 6| December 2016| Pages 1957-1966
https://doi.org/10.1107/S1600576716014175
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS