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Figure 8
(a) Diffuse scattering measurement in q-space representation and log scale. (b) DWBA calculation of the optimal PSD model based on the electron-density profile with the multilayer parameters for the combined analysis listed in Table 2[link]. (c) Vertical cut at the indicated white dashed cut positions in (a) and (b). The blue dashed lines show two limiting cases for the value of the vertical correlation length. The result is the model uncertainty in the PSD. (d) Comparison of the extracted effective PSDs from the diffuse scattering measurement (Measured Data) shown in (a) and the DWBA calculation of (b) at the horizontal cut positions indicated by the white dashed lines. The uncertainty interval for the extracted PSD is shown by the two dashed PSD profiles (see main text).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 6| December 2016| Pages 2161-2171
https://doi.org/10.1107/S1600576716015776
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