view article

Figure 12
Comparison between thin and thick areas of amorphous silica for obtaining ED-based PDFs using SUePDF. (a), (b) TEM images of thin and thick areas, respectively, for ED acquisition; (c) the corresponding ED-based PDFs for the thin (dashed blue line) and thick (solid red line) areas.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds