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Figure 5
The profiles of the incident X-ray beam (E = 25 keV) measured in EH2: (a) horizontal and (b) vertical using a beam of 100 × 100 and 250 × 250 µm.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 1| February 2017| Pages 172-183
https://doi.org/10.1107/S1600576716019750
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