New synchrotron powder diffraction facility for long-duration experiments

Murray, C.A.; Potter, J.; Day, S.J.; Baker, A.R.; Thompson, S.P.; Kelly, J.; Morris, C.G.; Yang, S.; Tang, C.C.

doi:10.1107/S1600576716019750

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 6
(a) SXPD pattern of CeO₂ powder standard and Rietveld refinement (main plot) produced from the two-dimensional pattern (inset). The measurement was performed using a beam of 25 keV [λ = 0.49466 (1) Å] and 60 s exposure time. (b) SXPD pattern of CeO₂ powder standard and the refinement obtained using a beam of E = 30 keV [λ = 0.41100 (5) Å] and 300 s exposure time.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 50| Part 1| February 2017| Pages 172-183

https://doi.org/10.1107/S1600576716019750

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