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Figure 2
Measured (black) and calculated (colored lines) [\theta]–[2\theta] XRD patterns of (a) the perfect [(TiNiSn3.25 uc/HfNiSn3.25 uc) × 200, blue] and (b) the distorted [(TiNiSn[_{{3.25\pm 0.5\,{\rm uc}}}]/HfNiSn[_{{3.25\pm 0.5\,{\rm uc}}}]) × 200, red] SLs. The arrows indicate the reflections that exhibit the greatest differences in the intensity between the measurement and the calculation with constant SL period. (c), (d) Two examples of patterns that reproduce the weak peak at [2\theta] = 28.3° but do not coincide with the positions of more intense satellites. Curves are shifted vertically for clarity.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 1| February 2017| Pages 288-292
https://doi.org/10.1107/S1600576716018379
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