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Figure 3
(a), (c), (e) XRD patterns of the layer designs shown in (b), (d) and (f), respectively. Black data represent measured patterns for respective layer stacks. Curves are shifted vertically for clarity.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 50| Part 1| February 2017| Pages 288-292
https://doi.org/10.1107/S1600576716018379
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