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Figure 2
Surface characterization by AFM (a), (b) and large-area XRD azimuthal scans (c) of Bi2Te3 samples BT-A and BT-B. Both samples show triangular pyramids on the surface; however, for sample BT-B the pyramids show two orientations different by 60/180°. The lattice plane indices of the preferred surface step orientation are indicated in (a). White dashed lines in (b) mark the boundary between areas with the two distinct orientations. (c) XRD azimuth scans of the ( ![]() |